Monday, November 5, 2012

1211.0489 (Ronny Knut et al.)

Interface characterization of Co2MnGe/Rh2CuSn Heusler multilayers    [PDF]

Ronny Knut, Peter Svedlindh, Klas Gunnarsson, Oleg Mryasov, Peter Warnicke, Dario Arena, Matts Björck, D. D. Sarma, Anindita Sahoo, Sumanta Mukherjee, Sari Granroth, Mihaela Gorgoi, Olof Karis
All-Heusler multilayer structures have been investigated by means of high kinetic x-ray photoelectron spectroscopy and x-ray magnetic circular dichroism, aiming to address the amount of disorder and interface diffusion induced by annealing of the multilayer structure. The studied multilayers consist of ferromagnetic Co2MnGe and non-magnetic Rh2CuSn layers with varying thicknesses. We find that diffusion begins already at comparably low temperatures between 200{\deg}C and 250{\deg}C, where Mn appears to be the most strongly diffusing element. The identified interlayer diffusion can be one reason why unexpectedly small values of the magnetoresistance are found for current-perpendicular-to-plane giant magneto-resistance devices based on this all-Heusler system, since actual devices are annealed at 250{\deg}C during fabrication.
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