A. A. Banishev, H. Wen, J. Xu, R. K. Kawakami, G. L. Klimchitskaya, V. M. Mostepanenko, U. Mohideen
The gradient of the Casimir force between a Si-SiO${}_2$-graphene substrate and an Au-coated sphere is measured by means of a dynamic atomic force microscope operated in the frequency shift technique. It is shown that the presence of graphene leads to up to 9% increase in the force gradient at the shortest separation considered. This is in qualitative agreement with the predictions of an additive theory using the Dirac model of graphene.
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http://arxiv.org/abs/1301.6631
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